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Matsusada Precision exhibits at 35th ELECTROTEST JAPAN

  • Event
35th ELECTROTEST JAPAN

Matsusada Precision is going to exhibit in the 35th ELECTROTEST JAPAN simultaneously with NEPCON JAPAN, from January 20th to 22th, 2021 in Tokyo Big Sight. We showcase many inspection systems which are perfect for diverse electric appliances including; semiconductors, electronic components, automobile parts and medical devices.

Matsusada's booth is located at W9-64. Our booth plans to display new high resolution low acceleration scanning electron microscope. We will be expecting you at our booth.

Dates
20th-22th January 2021 10:00am-6:00pm Last day until 5:00pm
Venue
Tokyo Big Sight
Zone
Non Destructive Inspection Zone
Booth
W9-64
Pre-Registration
Request free visitor Ticket to NEPCON JAPAN is here.

Main exhibits

This image is Precision µB3600.
  • New product

X-ray inspection system Precision µB3600

Compact and High Quality

Precision µB3600, a benchtop X-ray inspection system enables tube voltage 90kV output with compact body. The series features easy to put in and out samples while sitting.
Precision µX7800

X-ray inspection system Precision µX7800

Slim body and Large Visual Field Size

Precision µX7800, an all-around X-ray inspection system enables maximize visual field size of X-ray imaging. With the wide entrance, you can easily put in and out large samples. The X-ray inspection system can take various images with wide magnification.
Precision CT7400

X-ray CT system Precision CT7400

Full automatic setting for the best photographing condition

Precision CT7400 is a horizontal X-ray CT system featuring high resolution and high speed performance. Using its original conditioning system, there is no need for axis calibration, and you can fully automatically adjust the shooting condition and position.
Precision SEM5600
  • New product

New scanning electron microscope Precision SEM5600

Improvements operability with auto stage

Precision SEM5600 is a surface structure analysis SEM adopting the industry's first new optical Dual Lens SEM. Through Matsusada original technology, the SEM achieved high resolution observations of the low acceleration voltage.