Scanning Electron Microscope (SEM) is a type of electron microscope. By utilizing electrons, which have a much shorter wavelength than visible light, SEMs can achieve significantly higher resolution and produce more detailed images than conventional optical microscopes.
A scanning electron microscope scans a specimen with a narrowly focused electron beam in a vacuum. It constructs an image by mapping the intensity of the detected signals to the corresponding scan coordinates of the electron beam. Typically, images are formed using secondary electrons, which are emitted from the specimen's surface as a result of interaction with the primary electron beam. In addition to secondary electrons, SEMs can detect other signals such as backscattered electrons, transmitted electrons (in STEM mode), X-rays, and cathodoluminescence. These signals provide various information about the sample, including its surface topography, elemental composition, and electrical properties.
Among scanning electron microscopes, those that use transmitted electrons are called STEM (Scanning Transmission Electron Microscope). In some configurations, a negative bias voltage is applied to the sample stage. This technique, known as beam deceleration or retarding, improves image resolution, especially during low-energy imaging.
Matsusada Precision offers a wide range of power supplies for scanning electron microscopes, including the PrecisionSEM5600, high voltage power supplies for acceleration, filaments, bias, lenses, and detectors.
- Related words:
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- Electron Microscope
- Transmission Electron Microscopes (TEM)
- Electron Beam (E-beam)
- electron gun
- Electron Beam Lithography
- X-ray
- secondary electron
- incident electron
- bias
- cathode luminescence
Recommended products
In addition to Scanning Electron Microscope PrecisionSEM5600, we have various kind of products such as high voltage power supplies for acceleration that are available for electron microscopes along with power supplies for filaments, bias, lenses, and detectors.
